## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

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Page 25

Also in the structure

Also in the structure

**factor**F , the term involving the Debye - Waller**factor**( exp ( -B sin ? 0/12 ) ] falls as e - 1 / 4 ?. For energies of 25 keV ( ~ 0.5 A ) , the total diffracted power will be very small .Page 27

ANGULAR DEPENDENT INTENSITY

ANGULAR DEPENDENT INTENSITY

**FACTORS**The Lorentz and polarization**factors**, both arising from the geometry of the diffraction process ( Cohen , 1966 ; Cooper and Glasspool , 1976 ) , and an absorption**factor**, resulting from differing ...Page 74

When this occurs a weighting

When this occurs a weighting

**factor**g is introduced which designates the fraction of subgrains that are contained within the measured epitaxial distribution . One can define an incremental effective volume associated with the angular ...### What people are saying - Write a review

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### Contents

The Investigation of Composition | 63 |

Penetration Distance | 75 |

Choice of Binary System for Composition | 86 |

Copyright | |

11 other sections not shown

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### Common terms and phrases

absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening coefficients components composition concentration containing cooling cross section curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution donor effect electron elements emission energy et al example excitation experimental factor field function give given heat hyperfine important impurities increasing intensity interaction iron laser lattice layer less magnetic material measurements Metals method Monemar Mössbauer neighbor observed obtained occur optical parameter peak phase Phys position possible powders problem produce properties range rays recently recombination region relative residual stress ribbon sample semiconductors shift shown solid spacing specimen spectra spectrum sputtering steel stress structure studies substrate surface target techniques temperature term thickness values variation volume X-ray